From discovering new and improved ways to access our natural resources to exploring how fuel cells can be better fabricated, these developments are certain to have a lasting effect on industry thanks to advances at NINT’s surface chemistry laboratories.
Here, researchers have access to our state-of-the-art X-RAY Diffraction and Scanning Probe Microscopy equipment.
X-ray diffraction (XRD) is used to determine structural information of materials at the atomic scale (crystal lattices), nanoscale (molecules) and up to the micrometre range (such as thin films), from fluids, to powders, layered films, and perfect crystals.
- Position Sensitive area detector: Bruker HiStar GADDS system
- Linear Detection: Bruker scintillator (NaI)
Goniometer and Sample Stage
- ¼ cradle Eulerian stage with programmed motions for X, Y, Z, 2θ, Omega, Chi and Phi rotations.
Capabilities and Applications
- Grazing Incidence Diffraction (GID) and X-ray Reflectometry for determining layer properties such as thickness, density or roughness in Thin Film studies
- High resolution XRD: lattice spacings and mismatches, layer thicknesses as well as lattice defects and stacking faults.
- Phase analysis.
- Texture and Residual stress analysis.
- Conventional methods of Powder Diffraction for crystallography.
- Small Angle X-ray Scattering (SAXS).
- Heating stage: 1200°C (vacuum), 700°C (air).